Hinds Instruments
Posts by sarah:
- SPIE Optics & Photonics 2025 Posted on by Hinds Instruments in Events
- SPIE Photonics West 2025 Posted on by Hinds Instruments in Events
- Ultra-Safe Nuclear Corporation Enhances Safety and Productivity with Advanced TRISO Fuel Analysis Using Hinds Instruments’ Exicor® 2-MGEM Optical Anisotropy Factor Measurement System. Posted on by Hinds Instruments in News
- SPIE Optics & Photonics 2024 Posted on by Hinds Instruments in Events
- 2021 Global IC Shortage and Its Affects on Hinds PEM Production Posted on by Hinds Instruments in News
- JPL and Hinds Instruments: Celebrating Nearly Two Decades of Collaborative Design to Put PEMs in Space Under NASA Projects Posted on by Hinds Instruments in News
- Hinds Instruments names Bio-Logic Science Instruments Exclusive Worldwide Distributor for new CD MicroPlate Reader product Posted on by Hinds Instruments in News
- Hinds introduces PolSNAP™, a compact, precise, inexpensive Stokes Polarimeter Posted on by Hinds Instruments in News
- Hinds Instruments appoints new General Sales Manager Posted on by Hinds Instruments in News
- Hinds Instruments Announces PEM-based Polarization Imaging Posted on by Hinds Instruments in News
- Hinds Instruments and SolarWorld Lab collaborate on Publication Posted on by Hinds Instruments in News
- R&D 100 Award for 150 XT Mueller Polarimeter Posted on by Hinds Instruments in News
- Hinds Instruments Announces New Pan-European Dealer Posted on by Hinds Instruments in News
- Hinds Instruments and NYU Develop 4-PEM Mueller Matrix Polarimeter Posted on by Hinds Instruments in News
- Hinds Instruments Announces New Dealer in India Posted on by Hinds Instruments in News
- Oak Ridge National Lab and Hinds Instruments Sign CRADA Posted on by Hinds Instruments in News
- Hinds Instruments Announces Installation of GEN6 Exicor® with Auto-Tilt feature for FPD Birefringence Measurement at Global Flat Panel Display Manufacturer Posted on by Hinds Instruments in News
- Hinds Instruments Announces Installation of Next Generation Exicor® OIA Birefringence Measurement System Posted on by Hinds Instruments in News
- Hinds Photoelastic Modulators with Advanced Thermal Control Posted on by Hinds Instruments in News
- Residual Stress Birefringence in Optical Materials Posted on by Hinds Instruments in News