Awards & Recognition
2013. R&D 100 Award (150 XT Mueller Polarimeter)
2008. R&D 100 Award (2-MGEM Optical Anisotropy Factor Measurement System)
2008. SPIE Prism Award finalist (2-MGEM Optical Anisotropy Factor Measurement System)
2003. R&D 100 Award (Exicor® DUV Low Level Birefringence Measurement System)
2003. Photonics Circle of Excellence Award (Exicor® DUV Birefringence Measurement System)
2001. R&D 100 Award (Exicor® 150AT)
2001. Photonics Circle of Excellence Award (Exicor® 150AT)
2000. CLEO 2000 New Product Award (Exicor® 150AT)
Plus, a long history of public and proprietary IP achievements including US (20+) and international patents that continues to grow.
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Working together, we can discuss the suitability of our technology for your application, including a custom configuration of our base systems if needed.
Featured Article
Private: Fundamentals, Advances, and Artifacts in Circularly Polarized Luminescence (CPL) Spectroscopy
A practical guide to CPL spectroscopy, key to future promising applications.
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SPIE Photonics West 2025
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