Exicor® OIA Birefringence Measurement System

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Features
Specifications
Resources
Worldwide Offices

The Hinds™ Instruments Exicor^® OIA is the Premier Birefringence Measurement System for the evaluation of Lenses, Parallel Faced Optics and Curved Optics at normal and oblique incident angles. The system is built on Hinds Instruments award winning Photoelastic Modulator (PEM) based Exicor Birefringence Measurement technology. This next generation birefringence measurement system is providing the industry with new capabilities in the analysis and development of next generation lithographic lenses, lens blank and high value optics.

The system utilizes PEMs to modulate the polarization state of a light beam and advanced detection and demodulation electronics to measure how an optic has changed the polarization state. This results in the measurement of optical retardation of one polarization state relative to another at 90°. Birefringence and Fast Axis orientation, as well as theoretical residual stress, can be evaluated with this data.

Hinds Instruments and the Exicor Oblique Incident Angle Technology has been selected to evaluate optical birefringence in research and production by the world leaders in lithographic lens blanks and finished lenses. Our systems are unsurpassed.

Exicor OIA DUV view of the front inside — *Figure 1. The front inside of the Exicor OIA DUV.*

Exicor OIA sample viewed close up — *Figure 2. A close-up view of a sample in the Exicor OIA System.*

Exicor OIA System — *Figure 3. Exicor OIA system*

System Details

Custom configurations and accessories are available for these models. Please contact a representative for more details.

Features

Exicor^® OIA Software
Automatic scan of Parallel flats and Spherical lens types
Asphere can be scanned with Manual macro program
2D Maps of retardation and fast Axis orientation
Scan Statistics
Stage Forward Load Position (free access to samples stage from above)
UV and Laser Light Enclosure with safety Interlocks
Emergency OFF shut down buttons
System Status Light Tower
User Work Station with Computer and Monitor

Specifications

VIS Retardation measurement range:	0 to 300+nm
DUV Retardation measurement range:	0 to 90+nm
VIS Retardation Resolution / Repeatability:	0.001nm / ±0.03 (up to 3nm, 1% thereafter)
DUV Retardation Resolution / Repeatability:	0.001nm / ± 0.08 nm (up to 4nm, 2% thereafter)
Retardation Accuracy:	Better than ±0.2nm expected
Angular Resolution / Repeatability:	0.01° / <±0.5°
VIS Light Source Wavelength:	632.8nm
DUV Light Source Wavelength:	193nm
Modulation Technique/Frequency:	PEMLabs^TM Photoelastic Modulator / 50/60 kHz
Demodulation Analysis Technique:	Hinds Instruments Signaloc^TM Lock-in Amplifier

Resources

Videos

Exicor® OIA™

Oblique Incident Angle Birefringence Measurements System for lenses and lens blanks.

Product Bulletin

Exicor OIA Product Bulletin

Dimensions

Exicor® OIA Dimensions

Applications

Optical Lithography

Techniques

Birefringence Measurement

Worldwide Offices

Africa

Hinds Instruments, Inc.
7245 NE Evergreen Pkwy
Hillsboro, OR 97124
USA

Phone: 1.503.690.2000

Fax: 1.503.690.3000

Email: sales@hindsinstruments.com

Americas

Hinds Instruments, Inc.
7245 NE Evergreen Pkwy
Hillsboro, OR 97124
USA

Phone: 1.503.690.2000

Fax: 1.503.690.3000

Email: sales@hindsinstruments.com

Asia

India

Laser Science Services (I) Pvt. Ltd.
Offices in Navi Mumbai, Chennai, Delhi, Kolkata

Head Office:
A-454, TTC Industrial Area
MIDC, Mahape
Navi Mumbai, 400 710
INDIA

Phone: 91-22-41553232

Fax: 91-22-27781672

Email: sales@laserscience.in

Website: http://laserscience.co.in/

Japan

Tokyo Instruments Inc.
Attn: Mr. Toshihiko Masuda
T.I.Building,
6-18-14 Nishikasai Edogawa-Ku,
Tokyo 134-0088
JAPAN

Phone: +81 3 (3686) 4711

Fax: +81 3 (3686) 0831

Email: sales@tokyoinst.co.jp

Website: https://www.tokyoinst.co.jp

PR China (Integrated Components)

Aunion Tech Co Ltd – China HQ
Attn: Jinlong Wu
3rd Floor, Building 6,
2007 Hongmei Road,
Xuhui District, Shanghai, 200233 P.R. China
Phone: +86-21-51083793
Fax: +86-21-34241962
URL: www.auniontech.com

Aunion Tech Co Ltd – Shenzhen Branch
Attn: Mary Ma
Phone: 182-2167-2726
Email: lili-ma@auniontech.com
URL: www.auniontech.com

Aunion Tech Co Ltd – Beijing Branch
Attn: Allen Tian
Phone: 185-0166-2513
Email: jinquan-tian@auniontech.com
URL: www.auniontech.com

Aunion Tech Co Ltd – Wuhan Branch
Attn: William Zhao
Phone: 130-5208-0953
Email: Weiliang-Zhao@auniontech.com
URL: www.auniontech.com

Aunion Tech Co Ltd – Xi’an Branch
Attn: Jian Wang
Phone: 180-864-6606
Email: jian-wang @auniontech.com
URL: www.auniontech.com

Aunion Tech Co Ltd – Chengdu Branch
Attn: Yi Liu
Phone: 185-1625-1865
Email: yi-liu@auniontech.com
URL: www.auniontech.com

OPCrown Photonics Co Ltd – Beijing HQ
12B18, Changyin Bdg, No. 88 Yongding Rd
Haidian District, Beijing, P.R. China, 100039
Phone: 010-68214292
Fax: 010-68214191
Email: sales@opcrown.com
Attn: Rose Zhong
Phone 131 6171 4851
EMail: rose.zhong@opcrown.com
URL: www.opcrown.com

OPCrown Photonics Co Ltd – Wuhan Branch
Attn: Paul Liu
Phone: 137 9705 5601
Email: paul.liu@opcrown.com

OPCrown Photonics Co Ltd – Su Zhou Office
Attn: Sharon Ji
Phone: 188 6212 1645
Email: sharon.ji@opcrown.com

OPCrown Photonics Co Ltd – Chengdu Office
Attn: Bryan Zhang
Phone: 185 8378 9679
Email: bryan.zhang@opcrown.com

OPCrown Photonics Co Ltd – Shenzhen Branch
Attn: Nick Yuan
Phone: 136 3160 6196
Email: nick.yuan@opcrown.com

PR China (Research Components)

Aunion Tech Co Ltd – China HQ
Attn: Jinlong Wu
3rd Floor, Building 6,
2007 Hongmei Road,
Xuhui District, Shanghai, 200233 P.R. China

Phone: +86-21-51083793

Fax: +86-21-34241962

Website: https://www.auniontech.com/

South Korea

Opto Mechanical Associates (OMA) Co.
405-11,
Goong-dong,
Yusung-gu Daejeon 305 335
KOREA

Phone: +82 42 822 9501-3

Fax: +82 42 822 9504

Email: mail@omacom.co.kr

Website: https://www.omacom.co.kr

Taiwan (Integrated Components)

Aunion Tech Co Ltd
Attn: Jinlong Wu
Rm. 905, F Building,
Everbright Convention and Exhibition Center,
No. 86 Caobao Road, Shanghai 200235 P.R. China
Phone: +86-21-51083793
Fax: +86-21-34241962
Email: jinlong-wu@auniontech.com
URL: www.auniontech.com

OPCrown Photonics Co Ltd
Room 318, East 11th Bldg, No. 83 Fuxing Rd
Haidian District, Beijing, P.R. China, 100039
Phone: 010-68214292
Fax: 010-68214191
Email: sales@opcrown.com
URL: www.opcrown.com

Taiwan (Research Components)

Aunion Tech Co Ltd
Attn: Jinlong Wu
Rm. 905, F Building,
Everbright Convention and Exhibition Center,
No. 86 Caobao Road, Shanghai 200235 P.R. China

Phone: +86-21-51083793

Fax: +86-21-34241962

Email: jinlong-wu@auniontech.com

Website: https://www.auniontech.com/

Australia

GMP SA
Avenue des Baumettes 17
CH – 1020 Renes

Phone: +41 21 633 21 21

Fax: +41 21 633 21 29

Email: info@gmp.ch

Website: https://www.gmp.ch

The Netherlands

Alphen aan den Rijn

Acal BFi Netherlands BV
J.P. Thijsseweg 1e
2408 ER Alphen aan den Rijn
THE NETHERLANDS
Phone: +31 (0) 1 7244 6060
Fax: +31 (0) 1 7244 3414
Email: sales-nl@acalbfi.nl
URL: www.acalbfi.com/nl

Eindhoven

Acal BFi Netherlands BV
Luchthavenweg 53
5657 EA Eindhoven
THE NETHERLANDS
Phone: +31 (0) 4 0250 7400
Fax: +31 (0) 4 0250 7409
Email: sales-nl@acalbfi.nl
URL: www.acalbfi.com/nl

Ukraine (Research Components)

SPECTROPOL
ul. Trakt Lubelski 271 G
04-667 Warszawa
POLAND

Phone: +48 22 617 67 17

Fax: +48 22 617 67 97

Email: biuro@spectropol.pl

Website: https://www.spectropol.pl

United Kingdom

Milton Keynes

Wokingham

Middle East

Hinds Instruments, Inc.
7245 NE Evergreen Pkwy
Hillsboro, OR 97124
USA

Phone: 1.503.690.2000

Fax: 1.503.690.3000

Email: sales@hindsinstruments.com

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Resources & Support

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Private: Fundamentals, Advances, and Artifacts in Circularly Polarized Luminescence (CPL) Spectroscopy

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Exicor® OIA

Exicor® OIA

System Details

Exicor® OIA™

Africa

Americas

India

Japan

PR China (Integrated Components)

PR China (Research Components)

South Korea

Taiwan (Integrated Components)

Taiwan (Research Components)

Australia

Austria

Belarus (Research Components)

Czech Republic (Research Components)

Denmark

Estonia (Research Components)

Finland

France

Germany

Ireland

Italy

Latvia (Research Components)

Lithuania (Research Components)

Norway

Poland (Research Components)

Slovakia (Research Components)

Sweden

Switzerland

The Netherlands

Alphen aan den Rijn

Eindhoven

Ukraine (Research Components)

United Kingdom

Milton Keynes

Wokingham

Middle East

Get A Quote for Systems & Components

Find a representative

Resources & Support

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Private: Fundamentals, Advances, and Artifacts in Circularly Polarized Luminescence (CPL) Spectroscopy

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Exicor^® OIA